physics.med-ph
Dual energy X ray dark field material decomposition. Dual energy imaging is a clinically well established technique that offers several advantages over conventional X ray imaging. By performing measurements with two distinct X ray spectra, differences in energy dependent attenuation are exploited to obtain material specific information. This information is used in various imaging applications to improve clinical diagnosis. In recent years, grating based X ray dark field imaging has received increasing attention in the imaging community. The X ray dark field signal originates from ultra small angle scattering within an object and thus provides information about the microstructure far below the spatial resolution of the imaging system. This property has led to a number of promising future imaging applications that are currently being investigated. However, different microstructures can hardly be distinguished with current X ray dark field imaging techniques, since the detected dark field signal only represents the total amount of ultra small angle scattering. To overcome these limitations, we present a novel concept called dual energy X ray dark field material decomposition, which transfers the basic material decomposition approach from attenuation based dual energy imaging to the dark field imaging modality. We develop a physical model and algorithms for dual energy dark field material decomposition and evaluate the proposed concept in experimental measurements. Our results suggest that by sampling the energy dependent dark field signal with two different X ray spectra, a decomposition into two different microstructured materials is possible. Similar to dual energy imaging, the additional microstructure specific information could be useful for clinical diagnosis.