\section{Heuristic Derivation of the Generalized Widom Formula}
In $d$ dimensions we consider a specific real-space partition in which the boundary between the two subsystems is a plane whose normal direction is $\hat{n}_d$. This partition preserves the translational symmetries in $d-1$ dimensions perpendicular to $\hat{n}_d$, and one can perform partial Fourier transformation for all the physical degrees of freedom along these $d-1$ axes, since the momenta $k_{1,2,\cdots, d-1}$ are good quantum numbers. We thus view the momentum space as consisting of arrays of parallel 1D chains with spacings $\delta k_{1,2,...,d-1} = 2\pi/L_\bot$, where $L_\bot$ is the linear size of these transverse directions.

Using well-established results for free fermions and coupled harmonic lattice systems with critical surfaces \cite{Wolf, GioevKlich, dingprx12, Lai_EE4EBL}, we assume that each 1D chain in momentum space intersecting the critical Fermi surfaces (critical points) contributes a 2nd Renyi entanglement entropy (REE) $(c_{eff}/4) \ln \mathcal{L}_\|$ [or a von Neumann EE ($\nu$EE) $(c_{eff}/3) \ln \mathcal{L}_\|$] to the total leading REE~\cite{Calabrese2004, Calabrese2009}, where $\mathcal{L}_\|$ is the linear size of the (smaller) subsystem along $\hat{n}_d$ and $c_{eff}$ represents the effective number of free gapless modes for each 1D chain. Note that we only consider the universal part of the leading terms in REE \cite{Calabrese2004, Calabrese2009}, \textit{i.e.}, for each 1D chain the leading REE explicitly should be $\frac{c_{eff}}{4} \ln \mathcal{L}_\parallel + c_2$ \cite{Calabrese2009}, where $c_2$ is a non-universal constant that we ignore. For free fermions or Fermi liquids (FL) \cite{GioevKlich, Zhang11, dingprx12, Lai_EEreconstruct}, $c_{eff} = c_{F}=1$; for coupled harmonic lattice models realizing the lattice version of the Exciton Bose liquid phase (EBL)~\cite{Paramekanti02}, $c^{EBL}_{eff} =2$~\cite{Lai_EE4EBL}. For the Gutzwiller-projected wave function in 2D, the $c_{eff}$ is not known. Nevertheless, the leading REE can be obtained by counting the total number of chains (in momentum space) intersecting the critical surface, which corresponds to the critical surface cross-sectional area divided by the $(d-1)$ dimensional area spacing between the chains, {\it i.e.,} $(2\pi/L_\bot)^{d-1}$. Explicitly, the leading universal part of REE is
\begin{eqnarray}
S_{dD} &\dot{=}& \frac{c_{eff}}{4} \ln \mathcal{L}_\|  \frac{1}{2}  \frac{\int_{\partial \Gamma} \left| d\hat{S}_\Gamma \cdot \hat{n}_d\right|}{(2\pi/L_\bot)^{d-1}} \label{Eq:Lai}\\
\nonumber & = & \frac{c_{eff}}{8}\ln \mathcal{L}_\| \left( \frac{L_\bot}{2\pi}\right)^{d-1} \frac{\int_{\partial \Gamma}\int_{\partial A} \left | d\hat{S}_\Gamma \cdot d\vec{S}_A\right|}{2L_\bot^{d-1}} \\
& = & \frac{c_{eff}}{16} \frac{\ln \mathcal{L}_\|}{(2\pi)^{d-1}} \int_{\partial A} \int_{\partial \Gamma} \left| d\vec{S}_A \cdot d\hat{S}_\Gamma \right|,\label{supp:eq_WGK}
\end{eqnarray}
where $\dot{=}$ represents the leading contribution. $\mathcal{L}_\|$ is the linear size of the (smaller) subsystem along $\hat{n}_d$. The factor $1/2$ in the first line is due to the over counting of the cross-section. In the second line, we rewrite $\hat{n}_d$ as a real-space partition surface integral (with $d\vec{S}_A$ being the corresponding oriented area element whose direction is along the local normal direction) divided by the partition surface area in $d-1$ dimensions, $2L_\bot^{d-1}$. $\int_{\partial \Gamma}$ represents the surface integral along the critical surface in momentum space (with $d\hat{S}_\Gamma$ being the corresponding oriented area element). While we arrived at Eq.~\eqref{supp:eq_WGK} by considering a special partition, it is actually the correct formula for the free-fermion state for arbitrary cuts \cite{GioevKlich} if we set $c_{eff}=1$ and replace $\mathcal{L}_\|$ by the generic linear size of the smaller subsystem. For the Gutzwiller-projected wave function, if we consider an $L_y$-legged chain system with infinite length along the $x$-axis, the total number of gapless modes is $2L_y -1$.  In real 2D systems, taking periodic boundary conditions along the $y$ direction, we expect $c_{eff}$ for each line in momentum space to be $c_{eff} = 2 - 1/L_y\big{|}_{L_y\rightarrow \infty} \rightarrow 2$.

\begin{figure*}
   \centering
   \includegraphics[width=\linewidth]{ee_fs_uni_lattice.pdf}
   \caption{(a) Illustration of the different subsystem geometries on the triangular lattice that we consider for the REE calculations. We set $t\equiv 1$, and consider $t'/t = 1.0$ for the isotropic model. The colored regions represent the subsystems that we considered. The blue and red regions represent subsystems with size $L_A \times \alpha L_A$, where $\alpha =1/2, 1$. The green region represents the subsystem preserving translation along the $\bm{a}_2$ direction. (b) The REE, $S_2$, for different subsystem geometries for the isotropic case. We choose two setups to extract REE. For red squares, green diamonds and blue circles, we fix the whole system size and choose the subsystem size to be $L_A \times \alpha L_A$ with $\alpha = 1/2$ (blue circles), $1$ (red squares and green diamonds). For purple triangles, we fix the ratio of the linear size of the subsystem and that of the whole system to be $1/2$ ($L_A / L = 1/2$) and vary the value of $L$ to extract the REE. Based on Eq.~\eqref{supp:eq_WGK}, we plot $S_2/((1+\alpha)L_A)$ or $\gamma S_2/L_A$ vs $\ln (L_A)$. The slopes of the lines give the prefactor of the leading REE. }
\label{Fig:ee_fs_uni}
\end{figure*}

\section{REE by Variational Monte Carlo}
The variational wave function used here for a critical spin liquid with a spinon Fermi surface (SFS) is defined as
\begin{eqnarray}
|\psi\rangle=\mathcal{P}_{G}|\psi_{0}\rangle,
\end{eqnarray}
where $\mathcal{P}_{G}=\prod_{i}(1-n_{i\uparrow}n_{i\downarrow})$ is the Gutzwiller projector,
which enforces no double occupation on each site.
$|\psi_{0}\rangle$ is the ground state of the following mean-field Hamiltonian on the triangular lattice:
\begin{equation}\label{eq:SL}
{\cal H}_{\rm MF} = \sum_{\langle i,j\rangle,\sigma} t_{ij}c^{\dag}_{i,\sigma}c_{j,\sigma} + h.c.
\end{equation}
In a system with subsystems $A$ and $B$, the REE of order $n$ in $A$ is defined as
\begin{eqnarray}
S_{n}=\frac{1}{1-n}log[Tr\rho_{A}^{n}],
\end{eqnarray}
with the reduced density matrix associated with $A$, $\rho_{A}=Tr_{B}|\psi\rangle\langle\psi|$. We will focus on $n=2$ REE, $S_2$. To compute $S_2$, as in Ref.~\cite{Zhang11} we introduce an identical copy of the original system:
We divide the original system into two subsystems $a$ and $b$ and, likewise, the replica into $a'$ and $b'$.
The operator $Swap$ is introduced as $Swap|a,b\rangle|a',b'\rangle=|a,b'\rangle|a',b\rangle$, and the REE is
\begin{eqnarray}
e^{-S_{2}}=\frac{\langle\Psi|Swap|\Psi\rangle}{\langle\Psi|\Psi\rangle},
\end{eqnarray}
with $|\Psi\rangle$ the wave function of the product between the original system and its replica. The operator
\begin{eqnarray}
\langle Swap\rangle=\underset{a,b;a',b'}{\sum}P(a,b,a',b')\frac{\psi(a',b)\psi(a,b')}{\psi(a,b)\psi(a',b')}
\end{eqnarray}
is calculated according to the weight $P(a,b,a',b')=\frac{|\psi(a,b)|^{2}|\psi(a',b')|^{2}}{\underset{a,b}{\sum}|\psi(a,b)|^{2}\underset{a',b'}{\sum}|\psi(a',b')|^{2}}$ by variational Monte Carlo (VMC). In this method, we generate the Markov chain for each configuration of both the original system and its replica, and use the Metropolis algorithm \cite{metropolis} to update the configurations according to the probability distribution $P(a,b,a',b')$.

\begin{figure}
    \subfigure[von Neumann entanglement entropy]{\label{Fig:FFnuE_1to1}\includegraphics[width=\linewidth]{FFnuE_121.pdf}}
    \subfigure[Renyi entanglement entropy]{\label{Fig:FFRE_1to1}\includegraphics[width=\linewidth]{FFRE_121.pdf}}
    \caption{The Fermi surface size of free fermions is fixed to be equal to the one obtained from the spin structure factor. Here we choose the subsystem with $L_A \times L_A$ lattice sites along the $\bm{a}_1$ and $\bm{a}_2$ directions and calculate the von Neumann entanglement entropy ($\nu$EE) (a) and the REE (b).  (a) We find that the fitting line is $y\simeq 0.278 x + 0.355$. (b) We observe a stronger oscillating behavior in the Renyi entropy, which makes it harder to obtain a conclusive fitting line. Based on the current data, we get the fitting line to be $y\simeq 0.194 x + 0.331$.}
\label{Fig:FFEE_121}
\end{figure}

\begin{figure}
    \subfigure[von Neumann entanglement entropy]{\label{Fig:FFnuE_bipartite}\includegraphics[width=\linewidth]{FFnuE_bipartite.pdf}}
    \subfigure[Renyi entanglement entropy]{\label{Fig:FFRE_bipartite}\includegraphics[width=\linewidth]{FFRE_bipartite.pdf}}
    \caption{The Fermi surface size of free fermions is fixed to be equal to the one determined from the spin structure factor result. Here we choose the subsystem to preserve the translation symmetry along the $\bm{a}_2$ direction to obtain the $\nu$EE (a) and REE (b). In both cases, we find stronger oscillating behaviors compared with those in Fig.~\ref{Fig:FFEE_121}, but we still can obtain a consistent result for the $\nu$EE. (a) We find the fitting line to be $y = 0.282 x + 0.424$, whose slope is comparable to that in Fig.~S\ref{Fig:FFnuE_1to1} obtained in a different subsystem geometry. (b) The REE shows a very strong oscillating behavior, which makes it very difficult to find a fitting line. A linear fitting line based on the current data is $y = 0.260 x + 0.199$.}
\label{Fig:FFEE_bipartite}
\end{figure}

\section{REE of the Isotropic Case by Variational Monte Carlo}
The results for REE in the isotropic case $(t=t')$, with $t/t'$ representing the fermion hopping amplitudes in the Hamiltonian~Eq.~(\ref{eq:SL}) (prior to Gutzwiller projection), are shown in Fig.~\ref{Fig:ee_fs_uni}. Panel (a) illustrates three different subsystems that we use for calculating the REE. The red and blue regions represent, in general, the subsystem with $L_A \times \alpha L_A$ sites, while the green region represents the subsystem with $L_A \times L$ sites with periodic boundary condition along the $\bm{a}_2$ direction, where $L$ represents the full system length. In panel (b), the slopes of the lines give the value of $c_{eff} A_{sf}$. The red squares are consistent with the data in Ref.~\cite{Zhang11} on a $18 \times 18$ triangular lattice with periodic boundary condition along both the $\bm{a}_1$ and $\bm{a}_2$ directions. The green diamonds represent our numerical data on a system with $20 \times 20$ sites along the $\bm{a}_1$ and $\bm{a}_2$ directions. We remark that the consistency between these two results shows the convergence of REE from $L=18$ to $L=20$ clusters, and then the $L=18$ cluster is sufficient to illustrate our VMC results. The open purple triangles represent the REE associated with the subsystem, which is half of the whole system in our setup, with periodic boundary conditions along $\bm{a}_2$. Within the error bars, we can see that the slope of the latter is \textit{equal} to the former obtained using a different subsystem geometry. The equality can be explained using the formula, Eq.~\eqref{supp:eq_WGK}, which we elaborate below.

In the first setup with $\alpha=1$, the REE is associated with the subsystem with four boundaries with equal surface area $L_A$ on a 2D triangular lattice with $L\times L$ sites. For each surface in real space, the integral along the real-space surface contributes $2 L_A A_{sf}$ to REE leading to $S^I_2\doteq c_{eff} A_{sf} /(4\pi)L_A \ln (L_A)$ based on Eq.~\eqref{supp:eq_WGK}. On the other hand, if the subsystem only preserves translational symmetry along the $\bm{a}_2$ direction, in real space there are only two surfaces with surface area $L$. For each boundary the integral gives $2 L A_{sf}$ that results in REE as $S^{II}_2 \doteq c_{eff} A_{sf} /(8\pi)L \ln (L_A) = (2\gamma)^{-1} c_{eff} A_{sf} /(4\pi) L_A \ln (L_A)$, where we rewrite $L = L_A/\gamma$. Setting $\gamma = 1/2$ gives $S^I_2 \doteq S^{II}_2$. The consistency between the leading terms of $S^{I}_2$ and $S^{II}_2$ as shown in Fig.~\ref{Fig:ee_fs_uni}(b) suggests the applicability of the Widom formula for the gapless spin liquid with a SFS described by the Gutzwiller-projected wave function.

To further illustrate the applicability of the Widom formula to the gapless spin liquid states, we calculate the REE associated with a subsystem with different lengths along the $\bm{a}_1$ and $\bm{a}_2$ directions, which is chosen to be $L_A \times L_A/2$ in our work. If the Widom formula is applicable, the slopes of $S_2/((1+\alpha) L_A)$ vs $\ln(L_A)$ should be the same for different values of $\alpha$. The blue open circles in Fig.~\ref{Fig:ee_fs_uni}(b) are the data obtained in $L_A \times 1/2 L_A$ subsystems, and we can see that the slope is comparable to the previous results using different subsystem setups, which again suggest the validity of the Widom formula in this system.

\section{$\nu$EE and REE for Spinless Free Electrons in the Isotropic Case}
For free-fermion systems, we use the correlation function method \cite{Peschel2003} to obtain the $\nu$EE and REE in Figs.~\ref{Fig:FFEE_121} and \ref{Fig:FFEE_bipartite}. We use two kinds of subsystem setups illustrated in Fig.~\ref{Fig:ee_fs_uni}(a):  Setup 1: $L_A\times L_A$ subsystem [red region in Fig.~\ref{Fig:ee_fs_uni}(a)]; Setup 2: $L_A \times L$ subsystem with a periodic boundary along the $\bm{a}_2$ direction [green region in Fig.~\ref{Fig:ee_fs_uni}(a)]. The results are illustrated in Figs.~\ref{Fig:FFEE_121}-\ref{Fig:FFEE_bipartite}. In Fig.~\ref{Fig:FFEE_121}, we plot $S^F_\nu/((1+\alpha) L_A)$ $[S^F_2/((1+\alpha) L_A]$ vs $\ln(L_A)$, with $\alpha = 1$. In Fig.~\ref{Fig:FFEE_bipartite}, we plot $\gamma S^F_\nu/L_A$ $(\gamma S^F_2/L_A)$ vs $\ln(L_A)$, with $\gamma$ being the ratio between the subsystem length and that of the whole system, $\gamma = L_A/L = 1/2$. The numerical calculations have been performed up to the triangular lattice with $L=72$. In both cases, we observe stronger oscillating behaviors for the $S_2$ data in the free fermion systems, which makes it difficult to obtain the fitting lines. Focusing on the von Neumann entropy data, $S_\nu^F$, we find that the two different setups give comparable results. If we average the two slopes obtained in these two setups, we get the slope to be $\sim 0.28$. Utilizing the theoretical understandings that $S_\nu^F \dot{=} 4/3 S_2^F$ (the universal part of the entanglement entropy), we find that the theoretical slope for the REE data to be $0.21$, which is comparable to the average of the slopes in the two REE data in Figs.~\ref{Fig:FFEE_121}(b) and \ref{Fig:FFEE_bipartite}(b). The slope we obtained in this spinless free-fermion system is half of the value obtained in the Gutzwiller-projected wave function system, which again suggests that $c_{eff}\simeq 2$.

\begin{figure*}[t]
   \centering
   \includegraphics[width=\linewidth]{sq_ani07.pdf}
   \caption{(a) Side view of the spin structure factor within BZ for the anisotropic case $t'/t = 0.7$, where the black hexagon represents the BZ. There is a sharp and singular peak at ${\bf q}=0$ corresponding to the uniform real-space power-law decaying behavior. The much weaker singular lines near the boundary of the BZ correspond to the oscillating real-space behavior caused by the presence of the SFS. (b) Top view of the spin structure factor. The weak singular lines on the surface are due to the presence of the emergent SFS and the theoretical locations of these lines are at $\bm{k}_{FR} - \bm{k}_{FL}$, \textit{i.e.}, for an observation direction we can define a momentum $\bm{k}_{FR/L}$ associated with a right-moving (left-moving) patch, represented by the blue lines. The theoretical blue lines match with remarkable accuracy  with the singular lines obtained by numerical calculations on a triangular lattice consisting of $30\times 30$ sites.
 }
   \label{Fig:sq_ani07}
 \end{figure*}

\section{Long Wavelength Analysis of the Spin Structure Factor}
To establish the precise formula for the leading entanglement entropy of the Gutzwiller-projected wave function describing the gapless spin liquid with a SFS, we can numerically determine $c_{eff}$ by comparing the result of the spin structure factor $\mathcal{D}_{\bf q}$ and the REE results, where
\begin{eqnarray}\label{Eq:Sq}
\mathcal{D}_{\bf q} \equiv \sum_j \chi^s_j e^{-i {\bf q} \cdot {\bf r}_j},
\end{eqnarray}
and $\chi^s_j $ is the real-space spin correlation functions defined as
\begin{eqnarray} \label{Eq:spincorr}
\chi^s_j \equiv \sum_{\mu =x, y, z} \langle S^\mu_j S^\mu_{i=0}\rangle.
\end{eqnarray}
The emergent SFS in momentum space can be viewed as consisting of patches of critical surfaces which at the low-energy descriptions are independent to each other \cite{SSLee2009}. It is expected that these independent patches contribute \textit{equally} to REE with the same $c_{eff}$. To determine $c_{eff}$, we focus on the isotropic critical surface case, \textit{i.e.}, a circular critical surface. For an arbitrary observing direction $\hat{n}$, we can determine two momenta corresponding to the right-moving patch, $\bm{k}^n_{FR}$, and the left-moving patch, $\bm{k}^n_{FL}$, respectively. For an isotropic convex critical surface with an inversion center, the vector ${\bf A}_s^n \equiv \bm{k}^n_{FR} - \bm{k}^n_{FL}$ must pass through the center of the critical surface and, therefore, the cross-section of the isotropic convex critical surface can be determined by the length $A_s^n = |{\bf A}_s^n|= |\bm{k}^n_{FR} -\bm{k}^n_{FL}|$.

The wave vectors $\bm{k}^n_{FR} - \bm{k}^n_{FL}$ can be extracted by examining the spin structure factor. The power-law correlations in real space correspond to singularities in momentum space that can be revealed in the spin structure factor. At mean-field level, the power-law behavior can be explicitly determined. In general, the low-energy description dictates that the spin structure factor should show singularities at ${\bf q} = {\bf 0},~\bm{k}^n_{FR } - \bm{k}^n_{FL}$. Identifying $\bm{k}^n_{FR} - \bm{k}^n_{FL}$ along different directions can determine the cross-sections of the SFS at different directions. The exact result for the isotropic case is illustrated in Fig.~2 in the main text, which shows wiggling lines on the surface of the spin structure factor corresponding to the weak singularities of $\bm{k}^n_{FR} - \bm{k}^n_{FL}$. To numerically fit  the exact $\bm{k}^n_{FR} - \bm{k}^n_{FL}$, we assume that the Gutzwiller projection does not dramatically change the locations of the singularities, while only the exponents of the power-law behaviors of the singularities are modified. We then adopt a mean-field fermionic state with a Fermi surface at $1/2$-filling. Extracting $\bm{k}^n_{m,FR} - \bm{k}^n_{m,FL}$ of the mean-field ansatz, we find that the $\bm{k}^n_{m,FR} - \bm{k}^n_{m, FL}$ can fit the exact $\bm{k}^n_{FR} - \bm{k}^n_{FL}$, which indeed suggests that the Gutzwiller projection does not change dramatically the geometric information of the SFS in this system.

At mean-field level, the Hamiltonian for an isotropic fermionic tight-binding model without enlargement of unit cells is
\begin{eqnarray}
H_{mf}  =  \sum_\alpha \sum_{\langle {\bf r}, {\bf r}' \rangle} f^{\alpha \dagger}({\bf r}) A({\bf r} - {\bf r}') f^\alpha ({\bf r}'),
\end{eqnarray}
where $\langle...\rangle$ represents nearest-neighbors and $\alpha = 1,2$ represents the spin flavor of fermions. $f^{\alpha \dagger}({\bf r}) (f^\alpha({\bf r}))$ represents the fermion creation (annihilation) operator with flavor $\alpha$ at location ${\bf r}$. We assume translational invariance so that $A_{{\bf r} {\bf r}'} = A({\bf r} - {\bf r}')$, where the matrix $A({\bf r} - {\bf r}')$ represents the hopping matrix between sites at ${\bf r}$ and ${\bf r}'$.  The mean-field Hamiltonian can be diagonalized by the complex fermions in Fourier space as
\begin{eqnarray}
f^\alpha({\bf r}) = \sqrt{\frac{1}{N_{s}}} \sum_{{\bf k}\in BZ} e^{i {\bf k}\cdot {\bf r}}\mathfrak{f}^{\alpha}({\bf k}),
\end{eqnarray}
where $N_{s}$ is the number of sites, and the complex fermion field $f$ satisfies the usual anti-commutation relations, $\{ \mathfrak{f}^{\alpha \dagger} ({\bf k}),\mathfrak{f}^{\alpha'}({\bf k}') \} = \delta^{\alpha \alpha'} \delta_{{\bf k} {\bf k}'}$. The component of the spin-$1/2$ spin operator is
\begin{eqnarray}
S^\mu({\bf r}) = \sum_{\alpha, \beta=1,2} f^{\alpha\dagger}({\bf r}) \left( \frac{\sigma^\mu_{\alpha \beta}}{2} \right) f^{\beta}({\bf r}),
\end{eqnarray}
which can be expressed in Fourier space as
\begin{eqnarray}
&& S^{\mu}({\bf r})\simeq \sum_{{\bf k},{\bf k'}\in {\bf B.Z.}}\sum_{\alpha,\beta}  \frac{\sigma^\mu_{\alpha \beta}}{2N_s} \mathfrak{f}^{\alpha \dagger}({\bf k}) \mathfrak{f}^\beta ({\bf k'}) e^{-i({\bf k}-{\bf k'})\cdot {\bf r}}.
\end{eqnarray}
In order to determine the long-distance behavior at separation ${\bm r}$, we focus on patches near the Fermi surface where the group velocity is parallel or antiparallel to the observation direction $\hat{\bm n} = {\bm r}/|{\bm r}|$, because at large separation $|{\bm r}| \gg k_F^{-1}$, the main contributions to the correlations arise precisely from such patches.  Specifically, we introduce Right(R) and Left(L) Fermi patch fields and the corresponding energies
\begin{eqnarray}\label{fermi patches:momentum space}
&& f^{\alpha,(\hat{\bm n})}_P(\delta {\bm k}) = \mathfrak{f}^{\alpha}({\bm k}^{(\hat{\bm n})}_{FP} + \delta {\bm k}) ~,\\
&& \epsilon^{(\hat{\bm n})}_P (\delta {\bm k}) = |{\bm v}^{(\hat{\bm n})}_{FP}| \left( P \delta k_\parallel + \frac{\mathfrak{C}^{(\hat{\bm n})}_P}{2} \delta k_\perp^2 \right) ~, \label{fermi patches:energy}
\end{eqnarray}
where the superscript $(\hat{\bm n})$ refers to the observation direction and $P = R/L = +/-$; ${\bm v}^{(\hat{\bm n})}_{FP}$ is the corresponding group velocity (parallel to $\hat{\bm n}$ for the Right patch and anti-parallel for the Left patch); $\mathfrak{C}_{P = R/L}$ is the curvature of the Fermi surface at the Right/Left patch; $\delta k_\parallel$ and $\delta k_\perp$ are respectively components of $\delta {\bm k}$ parallel and perpendicular to $\hat{\bm n}$.  It is convenient to define fields in real space
\begin{eqnarray}\label{fermi patches:real space}
f^{\alpha,(\hat{\bm n})}_P({\bm r}) \sim \sum_{\delta {\bm k} \in {\rm Fermi~Patch}} f^{\alpha,(\hat{\bm n})}_P(\delta {\bm k}) e^{i\delta{\bm k} \cdot {\bm r}} ~,
\end{eqnarray}
which vary slowly on the scale of the lattice spacing [from now on, we will drop the superscript $(\hat{\bm n})$].  In this long-wavelength analysis, the relevant terms in the spin operator are
\begin{eqnarray}\label{Eq:spincorr_longwl}
 S^{\mu}({\bf r})\sim \sum_{P,P'}\sum_{\alpha, \beta} \sigma^{\mu}_{\alpha \beta} f^{\alpha\dagger}_{P}({\bf r}) f^{\beta}_{ P'}({\bf r}) e^{-i({\bf k}_{FP}-{\bf k}_{FP'})\cdot {\bf r}}.
\end{eqnarray}
The above long-wavelength expression for the $S^{\mu}$ operator implies that the corresponding correlation function defined in Eq.~\eqref{Eq:spincorr} contains contributions with ${\bf q}={\bf 0}$ and  ${\bf q}_{-}\equiv\bm{k}_{FR}- \bm{k}_{FL}$. More explicitly, for a patch specified by $\epsilon_P (\delta {\bm k})$ in Eqs.~\eqref{fermi patches:momentum space}-\eqref{fermi patches:energy}, we can derive the Green's function for the continuum complex fermion fields as
\begin{eqnarray}\label{long-wavelength:green function}
\langle f^{\alpha\dagger}_{R/L}({\bm 0}) f^{\alpha}_{R/L}({\bm r}) \rangle = \frac{\exp[\mp i \frac{3\pi}{4}]}{2^{3/2} \pi^{3/2} \mathfrak{C}_{R/L}^{1/2} |{\bm r}|^{3/2}} ~.
\end{eqnarray}
Using this and Eq.~\eqref{Eq:spincorr_longwl}, we can obtain the spin correlation
\begin{eqnarray}
\chi_s({\bf r}) &\sim& -\frac{1}{\mathfrak{C}_{R} |{\bf r}|^3} - \frac{1}{\mathfrak{C}_{L}|{\bf r}|^3}~\label{uniform:spin}\\
&+& \frac{2 \sin [ ( \bm{k}_{FR}-\bm{k}_{FL})\cdot {\bf r}] }{\mathfrak{C}_{R}^{1/2}\mathfrak{C}_{L}^{1/2} |{\bf r}|^3}. ~\label{krminuskl:spin}
\end{eqnarray}
Focusing on the structure factors $\mathcal{D}_{\bf q}$ defined in Eq.~\eqref{Eq:Sq}, we expect that there should be a cone-shaped singularity at ${\bf q}=0$, based on Eq.~\eqref{uniform:spin}:
\begin{eqnarray}
\mathcal{D}_{{\bf q}\sim 0} \sim |{\bf q}|,
\end{eqnarray}
which can be seen straightforwardly by performing Fourier transform exactly or by scaling analysis with ${\bf q} \sim {\bf r}^{-1}$. Furthermore, the spin structure factor should also reveal the singular surface at ${\bf Q}_{-} $, as expected from Eq.~\eqref{krminuskl:spin}.  At the long wavelength analysis at the mean-field level, we note that the singularities are expected to be one-sided,
\begin{eqnarray}
&& \mathcal{D}_{{\bf Q}_{-} + \delta {\bf q}}\sim |\delta q_{||}|^{3/2} \Theta (-\delta q_{||}).\end{eqnarray}

Fitting the exact $\bm{q} = \bm{k}_{FR} - \bm{k}_{FL}$ in the spin structure factor data illustrated in Fig.~2(b) in the main text, we extract the cross sections of the emergent SFS in the isotropic case to be the $5.24 \pm 0.05$ (where we set the lattice constant $a$ to be 1 and $\hbar = 1$), which allows us to obtain $c_{eff}\simeq2.01 \pm 0.02$.

\section{Spin Structure Factor of the Anisotropic Case}
The Fig.~\ref{Fig:sq_ani07} shows the 3D spin structure factor obtained on a triangular lattice with $30 \times 30$ sites for the anisotropic case $t'=0.7t$. The spin structure factor is defined as $D_{\bf q} \equiv \sum_j \chi^s_j e^{-i {\bf q} \cdot {\bf r}_j}$ with the real-space spin correlation function $\chi^s_j \equiv \sum_{\mu =x, y, z} \langle S^\mu_j S^\mu_{i \equiv0}\rangle$. It is known that for an observation direction $\hat{n}$, $D_{\bm{q}}$ should show singular peaks at $\bm{q} = \bm{0},~\bm{k}^{\hat{n}}_{FR} - \bm{k}^{\hat{n}}_{FL}$ associated with forward and backward scattering process. The Fig.~\ref{Fig:sq_ani07}(a) gives a side view of the $D_{\bm{q}}$ in the hexagonal Brillouin zone (B.Z.) where we observe a sharp singular point at $\bm{q} = 0$ and the wiggle lines on the surface correspond to the singular lines located at $\bm{k}^n_{FR} - \bm{k}^n_{FL}$. Unlike the isotropic case, we can see that the structure factor breaks the $C_6$ rotation. The Fig.~\ref{Fig:sq_ani07}(b) shows the top view of $D_{\bm{q}}$. To determine the location of the $\bm{k}^n_{FR} - \bm{k}^n_{FL}$, we adopt a mean-field fermionic state with a Fermi surface at $1/2$-filling. Extracting $\bm{k}^n_{m,FR} - \bm{k}^n_{m,FL}$ of the mean-field ansatz, where the subscript $m$ means mean-field, we find that the $\bm{k}^n_{m,FR} - \bm{k}^n_{m, FL}$ can fit the exact $\bm{k}^n_{FR} - \bm{k}^n_{FL}$ quite well for an arbitrary observation direction $\hat{n}$, which gives the locations of the weak singular lines on the surface of the 3D spin structure factor. In Fig.~\ref{Fig:sq_ani07}(b) the blue lines are obtained by examining the mean-field SFS spin liquid state, which overlap the weak singular lines on the surface of the 3D spin structure factor obtained by exact numerical calculations.


\section{Introduction}

Recent advances in nanofabrication of electronic devices require cutting-edge analytical technologies to provide a reliable structural characterisation of materials at the nanoscale. Such technologies are particularly important to probe molecular properties of cross-sections smaller than 100~nm in all three dimensions, which is of rapidly growing interest in the field of nanotechnology. Electronic chip manufacturing is currently introducing the sub-10~nm
fabrication node (a half pitch of a grating pattern) in the development of 3D fin-gates of field transistors. Nanofabrication techniques are now approaching single-digit-nm resolution using electron emission~\cite{Ivo} and thermal probes~\cite{Paul,Holzner}.
Further control of surface nano-texturing, to achieve regularly patterned features with sub-100~nm resolution, is
currently under development for inherent material properties, such as controllable
surface wettability, anti-biofouling, anti-reflection, and
biocidal/bactericidal properties~\cite{17n245301,13nc2838}. For example, the motheye plastic films produced by roll-to-roll technology already replicate nano-pillars with 100~nm separation (MOSMITE
from Mitsubishi Chemicals. Ltd.).

The structural and optical properties of material are interrelated. By using a wide spectrum of electromagnetic waves from visible to THz, it is possible to gain insights into complex hierarchical structures of composite materials. For materials with strong structural anisotropy, defined by the molecular orientation and alignment of crystalline micro-volumes, it is important to characterise structure at the highest lateral and longitudinal resolutions\textcolor{black}{~\cite{silksci,tiger}}. Anderson localisation of light and thermal cooling of silk at IR wavelengths was recently demonstrated to be related to the fibril sub-structure of silk, which was in the range of tens-of-nanometers~\cite{Local}. This defines the range of the spatial
resolution required for structural and
chemical analysis, which are typically carried out using X-ray and IR based techniques at larger scales.

Real and imaginary parts of the refractive index, $\tilde{n}= n + i\kappa$, together with the orientation dependency of the
birefringence $\Delta n$ and dichroism $\Delta\kappa$, define the optical response of materials. Reflectance $R$ is
proportional to the real part, while the absorbance $A$ corresponds to the
imaginary part of $\tilde{n}$. Recently, we demonstrated that the IR measurements of silk performed using three different methods, including \emph{(i)} a table-top Fourier
transform infrared (FTIR) transmission, \emph{(ii)} a
synchrotron-based attenuated total reflection (ATR) FTIR, and
\emph{(iii)} an atomic force microscopy (AFM) tip response to the
IR absorbed light (nano-IR~\cite{Dazzi}), produced comparable spectral features~\cite{17mre115028}. Whilst the first two modalities probe micron-sized volumes of silk, the AFM-based Nano-IR technique acquires structural information at the nanoscale (i.e. the area under the AFM tip \textcolor{black}{from} volume \textcolor{black}{with lateral cross-section of} $\sim 20$~nm). Differences in absorbance and spectral line-shapes of the characteristic silk bands are related to the
different sensitivity of $R$ and $A$ to the real and imaginary
parts of $\tilde{n}= n + i\kappa$. The absorbance measured from
the far-field transmission directly reflects
the imaginary part of the index $\kappa$, while those obtained in the ATR-FTIR mode are affected by the real part of the index \textit{via} the Snell's law~\cite{vib}. As a result, comparative measurements of the absorbance by different near- and far-field techniques are essentially required to understand differences in electric-field determination of the local light and its interaction with the sample~\cite{Huth}.

\begin{figure}
\begin{center}
\includegraphics[width=15cm]{f-bunch}
\caption{X-ray tomographic images showing 3D rendered volume of white
silk  \emph{Bombyx mori} fibers at 3.15~$\mu$m pixel resolution.
The bundle of silk fibers was made of degummed single strand silk fibers. }
\label{f-bunch}
\end{center}
\end{figure}

\textcolor{black}{Different modalities of sample preparation for nanoscale imaging include focused ion beam milling and micro-tome slicing. When thickness of samples, especially soft bio-materials, becomes close to 100~nm the cutting tool might cause a tear and cut induced strain under the surface. In turn, this can cause artefacts in determination of optical properties which are related to the mass density and its gradients. It is important to measure $n$ and $\kappa$ from decreasingly smaller volumes and to compare with data obtained from the bulk samples.}

Here, we used a near-field scattering method to probe $n, \kappa$ and to
determine spectral differences between the reflectance and absorbance
of silk fibers with $\sim 10$~nm resolution. Cross-sections of silk fibers
were prepared using an ultramicrotome. Silk was chosen due to its well known spectral properties
and its increasing applications as a biocompatible and biodegradable
material~\cite{Ling,Hotz}. \textcolor{black}{Silk has uniaxial symmetry which can be examined from longitudinal microtome slices used in this study.}  Sub-wavelength resolutions in
hyperspectral IR mapping of absorbance and orientational
properties of the absorbing bands were reliably measured from
100-nm-thick slices of silk. Such a high resolution technique is essential in order to gain a better understanding of the fibril structure of silk~\cite{Local}.
\begin{figure}
\begin{center}
\includegraphics[width=14cm]{f-silk}
\caption{(a) Wide-angle 2D x-ray diffraction of a bundle of white silk \emph{Bombyx mori} fibers. Inset shows an optical microscopic
image of \textcolor{black}{a convolved} silk \textcolor{black}{fiber} bundle. The silk bundle was made of degummed single
strand silk fibers. The long axis of the fibers was predominantly
vertical. (b) Optical image of white silk fibers through optically
aligned polariser-analyser (high transmission) setup under white
light illumination using a Nikon MPlan 10$^\times$ DIC objective lens
with numerical aperture $NA = 0.25$. } \label{f-silk}
\end{center}
\end{figure}

\section{Methods and samples}
\subsection{Silk slices}

Silk fibers were embedded in epoxy resin (Oken Ltd., Japan) and thin-sectioned by ultramicrotomy to achieve a sample thickness of  $\sim 100$~nm. Slices were then immobilised on IR-transparent non-birefringent substrates (CaF$_2$).

\subsection{X-ray characterisation}

A 3D X-ray computed micro-tomography (micro-CT) was performed using a lab-based ZEISS Versa 520 X-ray Microscope at the Stanford Nano Shared Facilities, Stanford University. The scan settings were as follows: source voltage - 30~kV, pixel size – 3.15~$\mu$m, number of projections – 1600, exposure time – 10~s. The micro-CT dataset was reconstructed using ZEISS Scout-and-Scan Reconstructor software (Fig.~\ref{f-bunch}).

2D X-ray diffraction of \emph{Bombyx mori} silk was carried out on a Bruker D8 Venture single crystal diffractometer using a Cu-Ka micro-focus X-ray source with wavelength of $\lambda = 1.5418\AA$ (Fig.~\ref{f-silk}(a)).

\subsection{IR spectral measurements}

The sub-diffraction scattering scanning near-field optical microscopy s-SNOM (neaspec GmbH) uses a metalized atomic force microscopy (AFM) tip which maps the surface relief (topography) by
its basic AFM operation, and simultaneously, under external infrared illumination (broadband laser working by difference-frequency generation, Toptica), acts as a light-concentrating antenna such that the sample is probed with a nanofocused light field. The AFM tapping mode operation (ca. 60~nm amplitude) modulates the near-field interaction between the tip
and sample~\cite{Hillenbrand}. An asymmetric Michelson interferometer and a lock-in detection of the signal at higher harmonic of the tapping frequency (approximately 250~kHz) provides
background-free nano-IR spectra and images with maximum resolution imposed by the AFM tip size independent of the laser wavelength~\cite{Huth}.

The nano-FTIR spectra were recorded in ca. 100~s/spectrum with a spectral resolution of 10~cm$^{-1}$. Removal of the instrumental response function from the nano-FTIR spectra was done
by normalization of the measured spectra to a reference Si signal. Resulting nano-FTIR absorption and reflectivity spectra can be directly correlated with the standard far-field IR spectra~\cite{Govyadinov,Westermeier}.

\begin{figure}
\begin{center}
\includegraphics[width=18cm]{f-retar1}
\caption{(a) A series of optical images taken at different voltages of a
liquid crystal (LC) retarder (schematically shown in the inset of (b)) and a Nikon Optiphot-pol
microscope with LMPlanFL 20$^\times$ objective lens $NA = 0.4$. (b) Calibration curve of retardance as a function of voltage collected at 635~nm wavelength and 22.8$^\circ$C.}\label{f-retar}
\end{center}
\end{figure}

Hyperspectral imaging of the absorbance was measured on the IR Microspectroscopy (IRM) Beamline at Australian Synchrotron (Victoria, Australia). The
measurements were performed using a Bruker Hyperion 2000 FTIR microscope (Bruker Optik GmbH, Ettlingen, Germany) coupled to a Vertex  V80v  FT-IR spectrometer equipped with a liquid
nitrogen-cooled narrow-band mercury cadmium telluride (MCT) detector. Holographic ZnSe wire-grid polarisers (Edmund) were used to set polarisation at the IR spectral range of $\lambda = 4000 - 750$~cm$^{-1}$ (2.5 - 13.3~$\mu$m); the extinction of polarisers was $T^{max}/T^{min}\simeq$150 and transmittance $\sim 50$\%. The far-field transmission measurements were carried out with a numerical aperture $NA = 0.5$, $36^\times$ magnification Cassegrain objective lens at the corresponding resolution of $0.61\lambda/NA \simeq 4.1~\mu$m at the 3000~cm$^{-1}$ band ($\lambda =$3.33~$\mu$m). The absorbance or optical density $A = -lg(T)$ spectrum is defined by the absorption
coefficient $\alpha\equiv 4\pi\kappa/\lambda =
2\omega\kappa/c$~[cm$^{-1}$] for the transmitted light intensity $I_T = I_0e^{-\alpha d} = I_0\times 10^{-OD}$; where $d$ is thickness of sample, transmittance $T = I_T/I_0$, $OD$ is optical density,
$\omega$ is the cyclic frequency of light, and $c$ is speed. The reflectance for the normal incidence from air is defined as $R = [(n-1)^2 + \kappa^2]/[(n+1)^2 + \kappa^2$].

\begin{figure}
\begin{center}
\includegraphics[width=16cm]{f-tome1}
\caption{(a) Far-field optical image of longitudinal
slices of white silk embedded in an epoxy sheet. \textcolor{black}{The inset shows schematics of a lateral silk slice composed of $\beta$-sheets interconnected with $\alpha$-coils and amorphous segments.} (b) Optical and topographic images
of the silk slice shown in (a) measured with scattering near-field
microscopy (SNOM; neaspec). Markers in optical image indicate
locations where spectra were acquired.} \label{f-tome}
\end{center}
\end{figure}
\begin{figure}
\begin{center}
\includegraphics[width=16cm]{f-spectra2}
\caption{Scattering near-field optical microscopy (SNOM)
measurements of the nano-FTIR
reflectance (a) and absorption (b) spectra
from selected points on silk and epoxy (shown in the right inset).} \label{f-spectra}
\end{center}
\end{figure}
\begin{figure}
\begin{center}
\includegraphics[width=18.5cm]{f-101}
\caption{(a) Single point absorbance spectra of thin-sectioned silk on BaF$_2$ collected at
different angles $\theta$ between the linear
polarisation and the fiber axis, using 2~$\mu$m pixel pitch, $15\times 15$ pixel points,
4.17~$\mu$m spatial resolution, and 4~cm$^{-1}$ spectral resolution. (b) Orientation color maps indicating that Amide A
(N-H) is oriented perpendicular to Amide I (C=O) and Amide II (C-N) bands. } \label{f-100}
\end{center}
\end{figure}

\section{Results and discussion}

X-ray diffraction is the method of choice to reveal the internal structure of complex materials and to detect crystalline regions. Figures~\ref{f-bunch} and \ref{f-silk}(a) show 3D reconstruction of the \emph{Bombyx mori} silk fibers bundled together and their X-ray diffraction (XRD) pattern, respectively. The period $d$ corresponds to the most pronounced peaks at the diffraction angle $2\theta$, given by the Bragg's condition $d =
\lambda/(2\sin\theta)$. The size $L$ of the nano-crystalline phase can be estimated from the Scherrer's equation $L =
K\lambda/(B(2\theta)\cos\theta$; where $K = 0.89$ for spherical crystals and $B(2\theta)$ is the peak's angular bandwidth at full width half maximum. The wide angle XRD pattern (Fig.~\ref{f-silk}(a)) is identical to that reported earlier~\cite{Drummy}. The most pronounced peak corresponds to the separation between the equatorial (200) planes $d_{(200)} =
4.69$~nm and crystal cross-section of $L\simeq 2.15$~nm, while for the meridional (002) planes $d_{(002)} = 3.46$~nm and crystal size
of $L\simeq 10.76$~nm~\cite{Drummy}. These are dimensions of the $\beta$-sheets, which are crystalline segments in the silk fiber. \textcolor{black}{SNOM measurements are well suited to measure $n$ and $\kappa$ from areas of comparable dimensions.}

Silk is a strongly birefringent material, as revealed by cross-polarised optical imaging (Fig.~\ref{f-retar}). The images were taken following adjustment of the voltage of a liquid crystal
(LC) retarder, which was inserted with its slow-axis perpendicular to the orientation of the silk fiber (see inset in (b)). Using such a geometry, it is possible to compensate for the silk fiber birefringence, $\Delta n\equiv n_e - n_o > 0$, with a phase delay imparted by the LC retarder. When the phase delay through the LC retarder is equal to
the absolute value, but has an opposite sign through the silk fiber, the most dark (black) region is formed in the image at $\sim 2.9$~V (Fig.~\ref{f-retar}(a)). For the thickness of
fiber $d = 48~\mu$m and measured retardance, the birefringence $\Delta n \simeq 4\times 10^{-3}$. This is an order of magnitude estimate since LC retarder calibration is made at single wavelength, while the imaging is captured under white light illumination. The birefringence originates from the structure, which has a fiber-orientation-determined alignment down to molecular bonds and spans hierarchically over a wide range of wavelengths due to secondary ordering~\cite{17m356}. Previously, longitudinal $\sim 1~\mu$m-thick silk slices were measured in transmission mode using synchrotron IR radiation to characterise the molecular alignment of
the typical amide bands~\cite{17sr7419}, including amide II at 1512~cm$^{-1}$ (C-N), amide I ($\beta$-sheets) at 1628~cm$^{-1}$ (C=O), and amide A at 3290~cm$^{-1}$ (N-H). Perpendicular
orientation between C=O and C-N bonding was revealed at a high accuracy when longitudinal silk slices were prepared~\cite{17sr7419}. \textcolor{black}{Longitudinal slices facilitated more precise measurements of molecular alignment since there were no averaging artefacts due to the curvature of silk fiber and different thickness across the fiber slice~\cite{recent}.}

Scattering SNOM was used to measure reflectance and absorbance spectra from nanoscale areas of a single silk slice. Lateral slices of
0.1~$\mu$m were prepared on a gold mirror (Fig.~\ref{f-tome}(a)).
Optical and topographic images were obtained, which confirmed the thickness of the silk slices to be $\sim 100$~nm (Fig.~\ref{f-tome}(b)). Spectra of
nano-FTIR reflectance and absorption from selected points were also measured (Fig.~\ref{f-spectra}) with a high reproducibility, showing a clear distinction between the silk and host-epoxy matrix. The nano-FTIR absorption is proportional to the
imaginary part of the scattering coefficient $\sigma_n(\omega) = s(\omega)e^{i\phi(\omega)}$, which relates the light scattered field $E_s(\omega)$, and the incident field $E_i(\omega)$ through the equation $E_s=\sigma_n E_i$; where $s(\omega)$ and $\phi{(\omega)}$ are the amplitude and phase of the back-scattered spectra~\cite{Huth}.
The reflectivity information is given by the real part of the scattering coefficient~\cite{Huth}. Using the asymmetric Michelson interferometer, the full complex function of the scattered optical signal could be recorded, therefore enabling the
simultaneous measurement of both nano-FTIR absorption and reflectivity spectra, shown in Fig.~\ref{f-spectra}.

The amide I and II bands were well reproduced in absorption spectra collected from four different single points; however, only spectra from two measurement points are displayed in
Fig.~\ref{f-spectra} for a better clarity of presentation. Nanoscale resolution is readily achievable for  SNOM measurements and is defined by the AFM tip, which has a diameter of $\sim 10$~nm. \textcolor{black}{Around the center of the absorption peak, regions of normal dispersion with a higher refractive index at a higher photon energy (proportional to wavenumber) was observed. Spectral positioning of the  absorption peak and dispersion lineshapes corresponded to the expected Lorenzian behaviour of a damped oscillator. }

Next, direct absorbance and orientation mapping~\cite{Hikima}
through a 100-nm-thick silk slice was demonstrated using
synchrotron IR radiation (Fig.~\ref{f-100}). By measuring absorbance
at several azimuth angles, $\theta$, it was possible to determine
molecular alignment within the fibril structure. Here, we demonstrate the use of the technique on the
thinnest silk section \textcolor{black}{of 100~nm}. The well aligned amide bands were \textcolor{black}{measured} in transmission mode at wavelengths, which are much longer than the thickness of the silk slice ($d = 100$~nm) when compared to the wavenumber
1500~cm$^{-1}$ equivalent to 6.67~$\mu$m wavelength. The pitch between measurement points was $2~\mu$m and was approximately two times smaller than the focal spot ($4.1~\mu$m). This caused an uncertainty in orientation azimuth at the boundary of the silk fiber and the surrounding epoxy matrix.
However, the central part of the fiber shows a well-defined
orientation, while the epoxy region has a random
orientation. The absorbance from silk, which makes only $d/\lambda
\simeq 1.5\%$ of the probing wavelength, was reliably measured \textcolor{black}{in transmission}. The retardance of silk, $d = 100$~nm, has $\Delta n = 4\times 10^{-3}$ birefringence at the non-absorbing visible-IR wavelengths. For example, the band at 3600~cm$^{-1}$ ($\lambda = 2.78~\mu$m) resulted in $\Delta
T = \sin^2(\pi\Delta n d/\lambda) = 2\times 10^{-5}\%$, which was
beyond the precision of measurements. Alternatively, the real part refractive index can be determined from the known reflectance $R$ and extinction $\kappa$ values following the equation $n = [(1+R)/(1-R)] + [4R/(1-R)^2-\kappa^2]^{1/2}$; however, $R$ was not measured in this experiment.

Anisotropy in absorption is defined by the dichroism $\Delta"\equiv(A_{\parallel}-A_{\perp})/2 =
k(\kappa_{\parallel} - \kappa_{\perp})d$;  where $k =
2\pi/\lambda$ is the wavevector. It defines the losses in transmission $T$, at the maximum and minimum orientations of linear
polarisation $e^{-\Delta^{"}} = \sqrt{T_{\parallel}/T_{\perp}}$.
The dichroism was estimated for the Amide bands: for the Amide A  $\Delta"\simeq 0.014$ suggests only a minute transmission
change $\sqrt{T_{\parallel}/T_{\perp}}\simeq 98.6\%$ for the two perpendicular polarisations. Similarly, the results obtained for the Amide I ($\Delta"\simeq 0.027$ and 97.4\%) and Amide II ($\Delta"\simeq 0.019$ and 98.1\%) also indicated that very small changes of absorbance of light passed through the thin $100$~nm lateral slices of the silk fiber. This shows that anisotropy of absorbance can be measured from nanoscale materials of sub-wavelength thickness. \textcolor{black}{There were no apparent spectral differences among few measured samples at different orientations of 100-nm-thick silk slices. The far-field (Fig.~\ref{f-100}) and near-field (Fig.~\ref{f-spectra}) absorbance spectra are comparable and are matching earlier results measured from thicker samples~\cite{17mre115028}. This study shows that the SNOM measurements reach resolution required to measure structural composition of silk fibres which correspond to the crystalline segments observed in XRD and the measurement can be carried out from nano-thin slices of silk. }

\section{Conclusions and outlook}

In summary, spectral characterisation, lateral mapping and
transmission with deep sub-wavelength resolution at IR molecular
fingerprinting spectral window were demonstrated using thin $100$~nm
lateral slices of silk. Absorbance and reflectance spectra of silk
with resolution of SNOM tip $\sim 10$~nm were obtained. Absorbance
from nano-thin silk slices with only 1.5\% of the wavelength were
measured when the beam diameter was comparable with the
IR-wavelength. Hyper-spectral mapping across the silk fiber slice
was obtained at a high accuracy and reproducibility. Orientational map of the amide bands was revealed \textcolor{black}{and was consistent with data collected from bulk samples. It shows that preparation of thin micro-tome slices of soft bio-materials is not altering their structure and opens possibility to read optical properties from nano-volumes. In the case of optical measurements, optical averaging over thicker inhomogeneous volumes of samples can be avoided using nano-slices and this provides more reliable direct measurement of optical properties}. The study demonstrated
characterisation of the silk fiber with a nano-scale resolution in all three dimensions.

\begin{acknowledgements}
\small{JM acknowledges a partial support by a JSPS KAKENHI Grant
No.16K06768 and 18H04506. We acknowledge partial support via ARC Discovery
DP170100131 grant. Experiments were carried out through a beamtime
proposal (ID. 12107) at the Australian Synchrotron IRM Beamline, part of ANSTO. We are grateful for R.~Kikuchi from Materials
Analysis Division of Tokyo Institute of Technology, Ookayama, for his assistance with ultramicrotomy. X-ray characterisation was performed at the Stanford Nano Shared Facilities (SNSF), supported by the National Science Foundation
under award ECCS-1542152. SJ is grateful for sabbatical stays at
Tokyo Institute of Technology and Shizuoka University. A part of this work was carried out under the Cooperative Research
Project Program of the Research Institute of Electronics, Shizuoka University.
}
\end{acknowledgements}

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